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Electron Microscopy and Nanoanalysis: Scanning Electron Microscopy (SEM)

Do you work in science, industry or research? This course is for everyone who wants to solve analytical problems. Our qualified team provides you with a step-by-step explanation of how to use a scanning electron microscope. After this three-day intensive course, you know how to interpret scanning electron microscopy results, and can undertake tests for material characterisation yourself, e.g. X-ray spectrum analyses.

FELMI-ZFE provides all interested parties from universities and industry with a comprehensive spectrum of the most modern testing methods for microstructural and microchemical material characterisation. The centre’s success is built on its interdisciplinary work, teaching and services provided for industry.

Content

  • You gain an overview of the possibilities of scanning electron microscopy and X-ray micro-level analyses of materials.
  • You become familiar with the newest developments in electron microscopy for material analysis.
  • You learn how to obtain and interpret significant images, spectra and element distribution images.
  • You work independently with the most modern scanning electron microscopes.

The course is divided into the following areas:

  • Introduction to (E)SEM (theory): Electron sources – lenses, electrons – sample interactions, secondary and back-scattered electron detectors, contrast mechanisms
  • Factors influencing image acquisition (microscope)
  • Sample preparation
  • Introduction to X-ray spectrometry (theory): information depth, inelastic scattering, detectors (wave length and energy dispersive), qualitative – quantitative analyses, element distribution images
  • Recording of X-ray spectra and element distribution images (microscope)
  • Analysis of samples brought (microscope)
  • Further analytical methods (theory): EBSD, variable pressure SEM, Dual Beam (SEM-FIB), transmission electron microscopy, vibrational spectroscopy

Target Groups and Admission Requirements

This course is aimed at scientists and technicians who want to develop or extend their knowledge of scanning electron microscopy.

There are no specific requirements for participating in this course.

Source: Margit Wallner – TU Graz

Dates and Deadlines

Next course date: March 2020

Quick Facts

  • Length: Blocked across 3 days
  • Certificate: Confirmation of participation
  • Language of instruction: German or English
  • Registration fee: € 1,050 (VAT free), including course handouts, drinks during breaks and lunch
  • Course location: TU Graz, Steyrergasse 17
  • Number of participants: max. 5
Bildquelle: Margit Wallner
Stefan Mitsche, programme director

It is always fascinating to work together with a small, diverse group. Participants come from Austria and abroad, as well as from many different fields – ranging from telecommunication to the pharmaceutical industry and the automotive sector. We have the chance to gain an insight into new points of view and perspectives, as well as identify possible opportunities for future cooperation.

Why you should Attend this Course

  • You profit from more than 20 years of experience and expert knowledge at the Institute for Electron Microscopy and Nanoanalysis (FELMI) at TU Graz
  • You will work with the most modern scanning electron microscopes (Zeiss Ultra, FEI ESEM Quanta 600 and 200) with field mission sources and X-ray detectors
  • You can bring your own samples and analyse them under the supervision of experts

Contact and Registration

Programme Director and Administration

Stefan MITSCHE
Dipl.-Ing. Dr.techn.
Phone: +43 316 873 8346
smitschenoSpam@tugraz.at

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