CERN (The European Organization for Nuclear Research), with its largest particle physics laboratory in the world, is accelerating science to the speed of light, trying to learn more about our universe. And a research team from IFE is now supporting CERN engineers in enabling this acceleration. In a cooperative experiment IFE scientists and CERN engineers are investigating modern microelectronics technologies for the next generation of particle detectors for high energy physics. Here are the first exciting results.
In March 2019 one of the most famous scientists in the field of electromagnetic compatibility (EMC), David Pommerenke, gave a talk about his recent findings in the field of electrostatic discharge (ESD). Numerous students and quite a number of interested researchers from various companies around Graz came to listen to his wonderful presentation.
The "EMV-Fachtagung" is the largest conference on electromagnetic compatibility in Austria. In 2019 the conference was held at campus Inffeldgasse. 14 talks, a big exhibition and a poster session over two days was bound to be a very interesting experience for over 140 participants.
All participants received a password and can download the EMV-Fachtagungsband (German) here.
Our youngest student, Nikolaus Juch, and the head of IFE, Bernd Deutschmann, gave an interview to the magazine "Elektrotechnik und Informationstechnik" (e&i) in 2018. Nikolaus talks a little about his current project, a singing tesla-coil, while Bernd fills us in about other projects and the research that is currently going on at the IFE. You can read the whole interview in German here.
The IFE now owns a Bulk Current Injection Test Setup according to the Standard ISO 11452-4. This setup can be used for Research, Development and Education. Beside other component test methods we now have one more powerful tool to investigate electronic systems and integrated circuits for automotive or other applications.
Hospital is a challenging environment, not only for people, but also for electronics. And in this challenging environment one has to be tough. In case of electronics it means tough against ionizing radiation or how we call it “RadHard”. For the past four years RadHard and HiRel team of IFE has worked on radiation hardened integrated circuits for next generation computed tomography, enabling faster and more reliable diagnostics. In this frame we have also took a more precise look at our “patient” – the microchip. In this experiment at LKH Graz back in 2016 we have investigated transients produced in a microchip by an X-ray pulse during a CT scan. Today our patient is well and healthy, ready to serve the mankind.