Electromagnetic compatibility (EMC)
Surface/near field scanning (visualization of the near and far E- and H-field)
Transient immunity (ESD gun, CDM, HBM, TLP)
Susceptibility to electromagnetic interference (EMI)
Microelectronic (robust analog IC design)
Development of ICs for robust electronic systems
IC Simulation and Modeling
EMI/EMC in analog circuits
Characterization of ICs and dedicated test chips
Radiation hardness and IC reliability
Reliability of electronic devices and ICs
Ionizing radiation effects on semiconductors (CMOS, )
Improvement of the reliability and robustness of ICs
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