With the atomic force microscope (AFM) Tosca 400 the sample is ‘scanned’ with a mechanical probe offering a three-dimensional analysis of the surface. Measurements with a high lateral and vertical resolution are obtained. The result contains topographical and mechanical information of the surface.
Scan range: 100 µm lateral and 15 µm vertical
A variety of samples can be measured by this technique.
Cantilever for contact and tapping mode
Prof. Dr. Michaela Flock
In publications, use of the Somapp Lab facilities might be acknowledged as follows:
'The authors would like to acknowledge use of the Somapp Lab, a core facility supported by the Austrian Federal Ministry of Education, Science and Research, the Graz University of Technology, the University of Graz and Anton Paar GmbH.’