With the atomic force microscope (AFM) Tosca 400 the sample is ‘scanned’ with a mechanical probe offering a three-dimensional analysis of the surface. Measurements with a high lateral and vertical resolution are obtained. The result contains topographical and mechanical information of the surface.
Scan range: 100 µm lateral and 15 µm vertical
A variety of samples can be measured by this technique.
Cantilever for contact and tapping mode
In publications, use of the Somapp Lab facilities might be acknowledged as follows:
'The authors would like to acknowledge use of the Somapp Lab, a core facility supported by the Austrian Federal Ministry of Education, Science and Research, the Graz University of Technology, the University of Graz and Anton Paar GmbH.’