18–20 March 2018
Problem Solving with Scanning Electron Microscopyand X-ray Microanalysis
Be a scientist, engineer or technician – you will profit from this course to solve your analytical problems. Our qualified staff will take you step-by-step through the use of advanced scanning electron microscopes during an intense 3 days hands-on workshop. You will gain deep insight into essential principles and methods in the field of scanning electron microscopy and x-ray microanalysis of materials.
We are using the latest equipment and know-how to assure that you will successfully take top quality images, spectra and elemental maps. The techniques are applicable to fields ranging from materials research (steel, ceramics, semiconductors, polymers, etc.) to biological research.
Feel free to bring your own samples; you will have the opportunity to analyse them on your own with professional help.
At FELMI-ZFE scientific curiosity meets experience in scanning electron microscopy – always at your service!
Organizer: Stefan Mitsche, Phone: +43 (0) 316/873-8346 Language: English or German (as required) Price: € 950.- (incl. course attendance, courseware, break time beverages, lunch) Place: FELMI Steyrergasse 17, 8010 Graz Number of participants: max. 5
5–8 February 2019Problem Solving with TEM
The joint FELMI/European EELS & EFTEM School is an intense 4-day hands-on laboratory workshop that will take you step-by-step through the acquisition and analysis of Energy Filtered TEM (EFTEM) and STEM-EELS data. The workshop will utilize the state of the art facilities at FELMI-ZFE including a monochromated probe-corrected Titan (S)TEM with a DualEELS GIF Quantum EELS system.
Our qualified staff will familiarize you with the latest EELS & EFTEM equipment and will teach you fundamental principles and methods which are crucial to take top quality EELS spectra, STEM-EELS spectrum images and energy-filtered images or elemental maps. While not a focus of the workshop, optimization of the source monochromator for high-resolution EELS and the Cs probe corrector for STEM-EELS is included in the program.
You will learn to apply practical techniques, how to use hardware and software systems as well as advanced EELS and EFTEM applications in a very efficient manner. The techniques are applicable to fields ranging from biological to materials research. Prior experience with transmission electron microscopy is beneficial, in the conventional and in the scanning (STEM) mode; a basic familiarity with EELS and EFTEM is an advantage.
We offer highly informative lectures, detailed discussions with experts in the field, and hands-on experience with various techniques. By the end of the course you will have the know-how to optimize the performance of your GIF as well as your EELS and EFTEM experimental setups in order to capture and extract the maximum amount of information from your TEM samples.
At FELMI-ZFE we have relied on our expertise with EELS and EFTEM for more than 20 years, and we look forward to helping you improve your skills!
Organizer: Gerald Kothleitner, Phone: +43 (0) 316/873-8336Price: € 1500,- (incl. courseware, break time beverages, lunch; excl. accommodation)Place: FELMI, Steyrergasse 17, 8010 GrazNumber of participants: max. 16
DI Dr. techn Stefan MitscheSteyrergasse 17/III8010 Graz, AustriaPhone: +43 (0) 316/873-8346E-Mail: stefan.mitschenoSpam@felmi-zfe.at
Ao.Univ.-Prof.DI.Dr. Gerald KothleitnerSteyrergasse 17/III8010 Graz, AustriaPhone: +43 (0) 316 873 8336E-Mail: gerald.kothleitnernoSpam@felmi-zfe.at