Over the last decades the field of electron microscopy has improved not only with respect to higher performance such as better resolution, but also establishment of new techniques. At FELMI-ZFE we participate in method development with both via academic research as well as cooperations with manufacturers of microscopes and analytical equipment.
Energy Filtered TEM (EFTEM) and Electron Energy Loss Spectroscopy treveal chemical information about a specimen. FELMI-ZFE scientists have contributed significantly to the development of EFTEM and EELS techniques and spectrometers over the last decades.
While conventional electron microscop methods usually deliver two-dimensional projections of a sample 3D-methods help to gain a deeper insight into the spatial structure of a specimen. A variety of methods was developed at FELMI-ZFE for the investigation of specimens of different dimensions with according resolutions.
The Environmental Scanning Electron Microscope (ESEM) overcomes the restrictions of a conventional SEM. Non-conductive specimens (e.g. polymers or biological samples) can be studied, even in situ tests can be performed using special tools like a tensile stage, a heating stage or Peltier cooling mountings of different geometries. Furthermore samples can be investigated in a wet environment, allowing condensation or crystallization.
Focused Ion Beam (FIB) is a versatile tool for both sample preparation as well as for the fabrication of nanostructures. However, at FELMI-ZFE FIB related scientific research is improving the instrument and the applied techniques FIB for sample preparation as well as for nanostructuring.
Institute of Electron Microscopy
Phone: +43 (0) 316 873 8320
Fax: +43 (0) 316 373 8822
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Phone: +43 (0) 316 873 8349