28 February 2018
How to detect defects within larger areas by means of elemental maps
In comparison to standard elemental maps the
large area mapping function of our new high-end EDX-Detector Oxford X-Max (attached to our new Zeiss Sigma 300) enables the acquisition of large sample areas (up to several centimetres) within very short time frames. The significantly larger detector (80mm²) area and efficient as well as fast signal processing electronics are the basis for high resolution analyses of considerable size.